Cite
HARVARD Citation
Schweitzer, D. et al. (2015). Thermal transient characterization of semiconductor devices with multiple heat sources—Fundamentals for a new thermal standard. Microelectronics journal. 46 (2), pp. 174-182. [Online].
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Schweitzer, D. et al. (2015). Thermal transient characterization of semiconductor devices with multiple heat sources—Fundamentals for a new thermal standard. Microelectronics journal. 46 (2), pp. 174-182. [Online].