Sub‐Terahertz Frequency‐Domain Spectroscopy Reveals Single‐Grain Mobility and Scatter Influence of Large‐Area Graphene. (18th March 2015)

• Record Type: Journal Article
• Authors: Cervetti, Christian; Heintze, Eric; Gorshunov, Boris; Zhukova, Elena; Lobanov, Svyatoslav; Hoyer, Alexander; Burghard, Marko; Kern, Klaus; Dressel, Martin; Bogani, Lapo
• Is Part Of: Advanced materials. Volume 27:Number 16(2015)
• Page Start: 2635
• Page End: 2641
• Publication Date: 2015-03-18
• Subjects: Materials -- Periodicals; Chemical vapor deposition -- Periodicals; 620.11
• DOI: 10.1002/adma.201500599
• Languages: English
• ISSNs: 0935-9648

Abstract

<abstract abstract-type="graphical" xml:lang="en" id="adma201500599-abs-0001"> <title> <x xml:space="preserve">Abstract</x> </title> <p> <bold>The response of individual domains</bold> in wafer‐sized chemical vapor deposition graphene is measured by contactless sub‐terahertz interferometry, observing the intrinsic optical conductance and reaching very high mobility values. It is shown that charged scatterers limit the mobility, validating previous theoretical predictions, and sub‐terahertz quality assessment is demonstrated, as necessary for large‐scale applications in touchscreens, as well as wearable and optoelectronic devices. <boxed-text content-type="graphic" position="anchor" orientation="portrait"><graphic position="anchor" mimetype="image" xlink:href="ark:/27927/pgjjm88pgr" orientation="portrait" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /></boxed-text></p> </abstract>