Influence of the carrier concentration on the piezotronic effect in a ZnO/Au Schottky junction1. Issue 10 (14th March 2015)

• Record Type: Journal Article
• Authors: Lu, Shengnan; Qi, Junjie; Gu, Yousong; Liu, Shuo; Xu, Qiankun; Wang, Zengze; Liang, Qijie; Zhang, Yue
• Is Part Of: Nanoscale. Volume 7:Issue 10(2015)
• Page Start: 4461
• Page End: 4467
• Publication Date: 2015-03-14
• Subjects: Nanoscience -- Periodicals; Nanotechnology -- Periodicals; 620.505
• DOI: 10.1039/c4nr07619b
• Languages: English
• ISSNs: 2040-3364

Abstract

<abstract abstract-type="toc"> <title> <x xml:space="preserve">Abstract</x> </title> <p> <graphic position="anchor" id="ga" xlink:href="ark:/27927/pgj92p47j6" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" />The influence of carrier concentration on piezotronics was assessed with a ZnO/Au Schottky barrier by SKPM and <italic>I</italic>–<italic>V</italic> measurements. The results show a gradual disappeared piezotronic effect with increasing carrier concentration, which was attributed to the strengthened screening effect.</p> </abstract>