Mapping strain modulated electronic structure perturbations in mixed phase bismuth ferrite thin films1. Issue 8 (28th February 2015)

• Record Type: Journal Article
• Authors: Krishnan, P. S. Sankara Rama; Aguiar, Jeffery A.; Ramasse, Q. M.; Kepaptsoglou, D. M.; Liang, W.-I.; Chu, Y.-H.; Browning, N. D.; Munroe, P.; Nagarajan, V.
• Is Part Of: Journal of materials chemistry. Volume 3:Issue 8(2015)
• Page Start: 1835
• Page End: 1845
• Publication Date: 2015-02-28
• Subjects: Materials -- Periodicals; Chemistry, Analytic -- Periodicals; Optical materials -- Research -- Periodicals; Electronics -- Materials -- Research -- Periodicals; 543.0284
• DOI: 10.1039/c4tc02064b
• Languages: English
• ISSNs: 2050-7526

Abstract

<abstract abstract-type="toc"> <title> <x xml:space="preserve">Abstract</x> </title> <p> <graphic position="anchor" id="ga" xlink:href="ark:/27927/pgj413w4bc" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" />A combination of atom column-by-column scanning transmission electron microscopy and density functional theory shows how epitaxial strain alters the local electronic structure in mixed phase bismuth ferrite thin films.</p> </abstract>