Improving the energy resolution of bent crystal X‐ray spectrometers with position‐sensitive detectors. (11th June 2014)

• Record Type: Journal Article
• Authors: Honkanen, Ari‐Pekka; Verbeni, Roberto; Simonelli, Laura; Moretti Sala, Marco; Al‐Zein, Ali; Krisch, Michael; Monaco, Giulio; Huotari, Simo
• Is Part Of: Journal of synchrotron radiation. Volume 21:Part 4(2014)
• Page Start: 762
• Page End: 767
• Publication Date: 2014-06-11
• Subjects: Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S1600577514011163
• Languages: English
• ISSNs: 0909-0495

Abstract

<abstract abstract-type="main" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <p>Wavelength‐dispersive high‐resolution X‐ray spectrometers often employ elastically bent crystals for the wavelength analysis. In a preceding paper [Honkanen <italic>et al.</italic> (2014). <italic>J. Synchrotron Rad.</italic><bold>21</bold>, 104–110] a theory for quantifying the internal stress of a macroscopically large spherically curved analyser crystal was presented. Here the theory is applied to compensate for the corresponding decrease of the energy resolution. The technique is demonstrated with a Johann‐type spectrometer using a spherically bent Si(660) analyser in near‐backscattering geometry, where an improvement in the energy resolution from 1.0 eV down to 0.5 eV at 9.7 keV incident photon energy was observed.</p> </abstract>