In-situ monitoring of vanadium dioxide formation using high-temperature XRD. Issue 2 (7th May 2014)

• Record Type: Journal Article
• Authors: Rodriguez, Mark A.; Bell, Nelson S.; Griego, James J. M.; Edney, Cynthia V.; Clem, Paul G.
• Is Part Of: Powder diffraction. Volume 29:Issue 2(2014)
• Page Start: 97
• Page End: 101
• Publication Date: 2014-05-07
• Subjects: Powder metallurgy -- Periodicals; Materials -- Analysis -- Periodicals; 620.1127
• DOI: 10.1017/S0885715614000311
• Languages: English
• ISSNs: 0885-7156

Abstract

<abstract abstract-type="normal"> <title> <x content-type="archive" xml:space="preserve">Abstract</x> </title> <p>The monoclinic-to-tetragonal phase transition (~70 °C) in vanadium dioxide (VO₂) strongly impacts the infrared properties, which enables its use in applications such as smart window devices. Synthesis of VO₂ can be challenging due to the variability of vanadium oxide phases that may be formed. We have employed high-temperature X-ray diffraction (HTXRD) to monitor the reaction process of vanadium oxide precursor powders to form the desired tetragonal VO₂ phase. Single-phase tetragonal VO₂ was formed within 30 min at 420 °C in flowing N₂ gas (~50 ppm O₂). The monoclinic-to-tetragonal phase transformation was observed via HTXRD at ~70 °C with the typical ~10 °C hysteresis (i.e. approached from above or below the transition).</p> </abstract>