Structural and Electronic Reconstructions at the LaAlO3/SrTiO3 Interface. (5th February 2013)

• Record Type: Journal Article
• Authors: Salluzzo, M.; Gariglio, S.; Torrelles, X.; Ristic, Z.; Di Capua, R.; Drnec, J.; Sala, M. Moretti; Ghiringhelli, G.; Felici, R.; Brookes, N. B.
• Is Part Of: Advanced materials. Volume 25:Number 16(2013)
• Page Start: 2333
• Page End: 2338
• Publication Date: 2013-02-05
• Subjects: Materials -- Periodicals; Chemical vapor deposition -- Periodicals; 620.11
• DOI: 10.1002/adma.201204555
• Languages: English
• ISSNs: 0935-9648

Abstract

<abstract abstract-type="graphical" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <p> <bold>A full understanding of the mechanism of the formation of a two‐dimensional electron gas (2DEG)</bold> at the interface between insulating LaAlO₃ (LAO) thin films and bulk SrTiO₃ (STO) crystals is a prerequisite for the full exploitation of this class of materials. Here, by using a combination of advanced X‐ray synchrotron‐based spectroscopic and structural measurements, it is shown that a structural and electronic reconstruction of the interface occurs before the realization of the 2DEG. <boxed-text content-type="graphic" position="anchor" orientation="portrait"><graphic position="anchor" mimetype="image" xlink:href="ark:/27927/pgg1zs0jv27" orientation="portrait" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /></boxed-text></p> </abstract>