Space‐Resolved In‐Plane Moduli of Graphene Oxide and Chemically Derived Graphene Applying a Simple Wrinkling Procedure. (13th December 2012)

• Record Type: Journal Article
• Authors: Kunz, Daniel A.; Feicht, Patrick; Gödrich, Sebastian; Thurn, Herbert; Papastavrou, Georg; Fery, Andreas; Breu, Josef
• Is Part Of: Advanced materials. Volume 25:Number 9(2013)
• Page Start: 1337
• Page End: 1341
• Publication Date: 2012-12-13
• Subjects: Materials -- Periodicals; Chemical vapor deposition -- Periodicals; 620.11
• DOI: 10.1002/adma.201204049
• Languages: English
• ISSNs: 0935-9648

Abstract

<abstract abstract-type="graphical" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <p> <bold>Mapping the in‐plane moduli:</bold> A simple wrinkling process on a deformable substrate requiring only readily available topographical atomic force microscopy (AFM) imaging allows space‐resolved determination of the mechanical properties of single graphene oxide and chemically derived graphene sheets. The lateral resolution in the sub‐micrometer range delivers unique insights into the defect distribution within the nanoplatelets. <boxed-text content-type="graphic" position="anchor" orientation="portrait"><graphic position="anchor" mimetype="image" xlink:href="ark:/27927/pgg1v8t2sfx" orientation="portrait" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /></boxed-text></p> </abstract>