XPS analysis of small particles by proximal X‐ray generation1. (18th March 2014)

• Record Type: Journal Article
• Authors: Castle, James Eric; Grilli, Rossana; Mallinson, Christopher F.; Abel, Marie‐Laure; Rossi, Antonella; Watts, John F.
• Is Part Of: Surface and interface analysis. Volume 46:Number 10/11(2014)
• Page Start: 949
• Page End: 951
• Publication Date: 2014-03-18
• Subjects: Surfaces (Physics) -- Periodicals; Surface chemistry -- Periodicals; Thin films -- Periodicals; 541.33
• DOI: 10.1002/sia.5452
• Languages: English
• ISSNs: 0142-2421

Abstract

<abstract abstract-type="main"> <title> <x xml:space="preserve">Abstract</x> </title> <p>In this work, the feasibility of XPS analysis using locally generated Al Kα radiation has been demonstrated. Both photo and Auger‐electron signals can be obtained from a single, sub‐micrometre, particle, achieving the aim of chemical state identification by means of the Auger parameter. The results, demonstrated in this work using copper particles on an aluminium substrate, suggest that the technique, with further development, will be valuable for those concerned with the health hazards of nano‐particles in general. Copyright © 2014 John Wiley &amp; Sons, Ltd.</p> </abstract>