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HARVARD Citation
Denny, Y. et al. (2014). Ni K‐edge XAFS analysis of NiO thin film with multiple scattering theory1. Surface and interface analysis. pp. 997-999. [Online].
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Denny, Y. et al. (2014). Ni K‐edge XAFS analysis of NiO thin film with multiple scattering theory1. Surface and interface analysis. pp. 997-999. [Online].