Inspection of morphology and elemental imaging of single nanoparticles by high‐resolution SEM/EDX in transmission mode1. (21st March 2014)

• Record Type: Journal Article
• Authors: Hodoroaba, Vasile‐Dan; Rades, Steffi; Unger, Wolfgang E. S.; Abel, Marie‐Laure; Rossi, Antonella; Watts, John F.
• Is Part Of: Surface and interface analysis. Volume 46:Number 10/11(2014)
• Page Start: 945
• Page End: 948
• Publication Date: 2014-03-21
• Subjects: Surfaces (Physics) -- Periodicals; Surface chemistry -- Periodicals; Thin films -- Periodicals; 541.33
• DOI: 10.1002/sia.5426
• Languages: English
• ISSNs: 0142-2421

Abstract

<abstract abstract-type="main"> <title> <x xml:space="preserve">Abstract</x> </title> <p>In the frame of the European project <italic>NanoValid</italic>, potential candidates of reference nanomaterials are manufactured and systematically characterized in particular with respect to their morphology (shape, size and size distribution). In this study, by exploiting the transmission operation mode in a high‐resolution SEM, known as transmission SEM, the potential of this methodical approach is demonstrated by means of representative examples of nanoparticles. The method enables quick and accurate morphological inspection and systematic characterization. Energy dispersive X‐ray spectroscopy imaging of single nanoparticles by using the transmission mode is demonstrated as feasible, too. Copyright © 2014 John Wiley &amp; Sons, Ltd.</p> </abstract>