Investigation of silica nanoparticles by Auger electron spectroscopy (AES)1. (16th January 2014)

• Record Type: Journal Article
• Authors: Rades, S.; Wirth, T.; Unger, W.; Abel, Marie‐Laure; Rossi, Antonella; Watts, John F.
• Is Part Of: Surface and interface analysis. Volume 46:Number 10/11(2014)
• Page Start: 952
• Page End: 956
• Publication Date: 2014-01-16
• Subjects: Surfaces (Physics) -- Periodicals; Surface chemistry -- Periodicals; Thin films -- Periodicals; 541.33
• DOI: 10.1002/sia.5378
• Languages: English
• ISSNs: 0142-2421

Abstract

<abstract abstract-type="main"> <title> <x xml:space="preserve">Abstract</x> </title> <p>High‐priority industrial nanomaterials like SiO₂, TiO_2, and Ag are being characterized on a systematic basis within the framework of the EU FP7 research project <italic>NanoValid</italic>. Silica nanoparticles from an industrial source have been analyzed by Auger electron spectroscopy. Point, line, and map spectra were collected. Material specific and methodological aspects causing the special course of Auger line scan signals will be discussed. Copyright © 2014 John Wiley &amp; Sons, Ltd.</p> </abstract>