Differentiating diterpene resin acids using ToF‐SIMS and principal component analysis: new tools for assessing the geochemistry of amber. (2nd April 2014)
- Record Type:
- Journal Article
- Title:
- Differentiating diterpene resin acids using ToF‐SIMS and principal component analysis: new tools for assessing the geochemistry of amber. (2nd April 2014)
- Main Title:
- Differentiating diterpene resin acids using ToF‐SIMS and principal component analysis: new tools for assessing the geochemistry of amber
- Authors:
- Sodhi, Rana N. S.
Mims, Charles A.
Goacher, Robyn E.
McKague, Bruce
Wolfe, Alexander P. - Abstract:
- <abstract abstract-type="main"> <title> <x xml:space="preserve">Abstract</x> </title> <p>Amber is a polymerized plant resin having remarkable preservation potential in the geological record. Numerous analytical techniques have been applied to the study of amber organic chemistry in order to extract paleobotanical information. However, only exploratory work has been conducted using time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS), despite its immense potential due to the high mass resolution and range that can be analyzed concurrently. Detailed assessments of ion fragmentation patterns are prerequisite, given that amber is comprised of a challenging range of terpenoids, carboxylic acids, alcohols, and associated esters. In recent work, we demonstrated the applicability and efficiency of ToF‐SIMS as a tool to investigate amber chemical composition. However, only two diterpene resin acid standards were considered in this preliminary study, namely abietic acid and communic acid. We now extend this work by documenting the ToF‐SIMS spectra of ten additional diterpene resin acids and ask whether ToF‐SIMS analysis can distinguish subtle differences within a larger set of diterpenoids. Both positive and negative ToF‐SIMS spectra were produced, although negative polarity appears particularly promising for differentiating diterpene resin acids. Principal component analysis (PCA) was used to distill the data and verified that purified diterpenes have distinct ToF‐SIMS spectra<abstract abstract-type="main"> <title> <x xml:space="preserve">Abstract</x> </title> <p>Amber is a polymerized plant resin having remarkable preservation potential in the geological record. Numerous analytical techniques have been applied to the study of amber organic chemistry in order to extract paleobotanical information. However, only exploratory work has been conducted using time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS), despite its immense potential due to the high mass resolution and range that can be analyzed concurrently. Detailed assessments of ion fragmentation patterns are prerequisite, given that amber is comprised of a challenging range of terpenoids, carboxylic acids, alcohols, and associated esters. In recent work, we demonstrated the applicability and efficiency of ToF‐SIMS as a tool to investigate amber chemical composition. However, only two diterpene resin acid standards were considered in this preliminary study, namely abietic acid and communic acid. We now extend this work by documenting the ToF‐SIMS spectra of ten additional diterpene resin acids and ask whether ToF‐SIMS analysis can distinguish subtle differences within a larger set of diterpenoids. Both positive and negative ToF‐SIMS spectra were produced, although negative polarity appears particularly promising for differentiating diterpene resin acids. Principal component analysis (PCA) was used to distill the data and verified that purified diterpenes have distinct ToF‐SIMS spectra that can be applied to amber chemotaxonomy as well as to the analysis of modern resins of known botanical origin. While this work is pertinent to the study of the composition and histories of ambers, the mass spectra of the 12 diterpene standards could prove valuable to any system where diterpenoid chemistry plays a role. Copyright © 2014 John Wiley &amp; Sons, Ltd.</p> </abstract> … (more)
- Is Part Of:
- Surface and interface analysis. Volume 46:Number 6(2014)
- Journal:
- Surface and interface analysis
- Issue:
- Volume 46:Number 6(2014)
- Issue Display:
- Volume 46, Issue 6 (2014)
- Year:
- 2014
- Volume:
- 46
- Issue:
- 6
- Issue Sort Value:
- 2014-0046-0006-0000
- Page Start:
- 365
- Page End:
- 371
- Publication Date:
- 2014-04-02
- Subjects:
- Surfaces (Physics) -- Periodicals
Surface chemistry -- Periodicals
Thin films -- Periodicals
541.33 - Journal URLs:
- http://onlinelibrary.wiley.com/ ↗
- DOI:
- 10.1002/sia.5416 ↗
- Languages:
- English
- ISSNs:
- 0142-2421
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 8547.742000
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 3397.xml