High‐Throughput Screening of Thin‐Film Semiconductor Material Libraries I: System Development and Case Study for TiWO. Issue 7 (27th February 2015)

• Record Type: Journal Article
• Authors: Sliozberg, Kirill; Schäfer, Dominik; Erichsen, Thomas; Meyer, Robert; Khare, Chinmay; Ludwig, Alfred; Schuhmann, Wolfgang
• Is Part Of: ChemSusChem. Volume 8:Issue 7(2015:Apr.)
• Page Start: 1270
• Page End: 1278
• Publication Date: 2015-02-27
• Subjects: Green chemistry -- Periodicals; Sustainable engineering -- Periodicals; Chemistry -- Periodicals; Chemical engineering -- Periodicals; 660
• DOI: 10.1002/cssc.201402917
• Languages: English
• ISSNs: 1864-5631

Abstract

<abstract abstract-type="main" xml:lang="en"> <title>Abstract</title> <p>An automated optical scanning droplet cell (OSDC) enables high‐throughput quantitative characterization of thin‐film semiconductor material libraries. Photoelectrochemical data on small selected measurement areas are recorded including intensity‐dependent photopotentials and ‐currents, potentiodynamic and potentiostatic photocurrents, as well as photocurrent (action) spectra. The OSDC contains integrated counter and double‐junction reference electrodes and is fixed on a precise positioning system. A Xe lamp with a monochromator is coupled to the cell through a thin poly(methyl methacrylate) (PMMA) optical fiber. A specifically designed polytetrafluoroethylene (PTFE) capillary tip is pressed on the sample surface and defines through its diameter the homogeneously illuminated measurement area. The overall and wavelength‐resolved irradiation intensities and the cell surface area are precisely determined and calibrated. System development and its performance are demonstrated by means of screening of a TiWO thin film.</p> </abstract>