Effect of substrate temperature on structural, morphology and optical properties of RF magnetron sputtered CZT thin films. (28th March 2015)

• Record Type: Journal Article
• Authors: Pugalenthi, A. S.; Balasundaraprabhu, R.; Prasanna, S.; Thilagavathy, K.; Muthukumarasamy, N.; Jayakumar, S.
• Is Part Of: Materials technology. Volume 30:Number 4(2015)
• Page Start: 200
• Page End: 204
• Publication Date: 2015-03-28
• Subjects: Materials -- Periodicals; Materials science -- Periodicals; Materials -- Technological innovations -- Periodicals; 620.1105
• DOI: 10.1179/1753555714Y.0000000244
• Languages: English
• ISSNs: 1066-7857

Abstract

<abstract> <title> <x content-type="archive" xml:space="preserve">Abstract</x> </title> <p>Cadmium zinc telluride (CdZnTe) or CZT, a direct band gap semiconductor is used in a variety of applications such as radiation detectors, photo refractive gratings, solar cells and electro-optic modulators. In the present investigation, we have studied the influence of substrate temperature on the structure, morphology and optical properties of radio frequency magnetron sputtered cadmium zinc telluride (Cd_0·4Zn_0·1Te_0·5) thin films deposited onto well cleaned glass substrates. CZT thin films of different thicknesses in the range from 128 to 549 nm with stoichiometric composition were prepared by optimising the process parameters. Transmittance spectra of thin films were recorded using UV-vis spectrophotometer in the wavelength range of 200 to 1500 nm and the optical band gap was determined. Surface topography of CZT thin films was analysed using atomic force microscopy and the root mean square roughness was determined. X-ray diffraction and transmission electron microscopy analysis revealed the presence of zinc blende structure exhibiting the predominant (111) and other planes along (220) and (311) directions. The d-spacing and crystallite size were also calculated. The results are discussed.</p> </abstract>