Undercooling measurement and nucleation study of silicon droplet solidification. Issue 1 (23rd September 2014)

• Record Type: Journal Article
• Authors: Tsoutsouva, M.G.; Duffar, T.; Garnier, C.; Fournier, G.
• Is Part Of: Crystal research and technology. Volume 50:Issue 1(2015:Jan.)
• Page Start: 55
• Page End: 61
• Publication Date: 2014-09-23
• Subjects: Crystallography -- Periodicals; 548
• DOI: 10.1002/crat.201400165
• Languages: English
• ISSNs: 0232-1300

Abstract

<abstract abstract-type="graphical" xml:lang="en" id="crat201400165-abs-0001"> <title> <x xml:space="preserve">Abstract</x> </title> <p>An experimental setup has been designed and developed for the study of nucleation phenomena, where a silicon droplet is directly placed, melted and solidified on a substrate. The melting‐solidification process was filmed and the undercooling temperature was measured by monochromatic and bichromatic pyrometers. It was found that the nature of the material of the substrate plays a role on the solidification process and droplet formation. The figure illustrates the macroscopic top/side views of solidified silicon droplets on fused silica and zyarock substrates. <boxed-text content-type="graphic" position="anchor" orientation="portrait"><graphic position="anchor" mimetype="image" xlink:href="ark:/27927/pgh372mj98p" orientation="portrait" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /></boxed-text></p> </abstract>