Electron Scattering: Nature of Electron Scattering in LaAlO3/SrTiO3 Interfaces Near the Critical Thickness (Adv. Mater. Interfaces 1/2015). Issue 1 (January 2015)

• Record Type: Journal Article
• Authors: Li, C. J.; Lü, W. M.; Wang, X. Renshaw; Qiu, X. P.; Sun, L.; Zeng, S. W.; Liu, Z. Q.; Huang, Z.; Zhao, Y. L.; Ariando; Venkatesan, T.
• Is Part Of: Advanced materials interfaces. Volume 2:Issue 1(2015)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2015-01
• Subjects: Materials science -- Periodicals; 620.11
• DOI: 10.1002/admi.201570001
• Languages: English
• ISSNs: 2196-7350

Abstract

<abstract abstract-type="graphical" xml:lang="en" id="admi201570001-abs-0001"> <title> <x xml:space="preserve">Abstract</x> </title> <p>M. Lü, T. Venkatesan, and co‐workers demonstrate in article 1400437 the percolation of two dimensional electron gases (2DEG) at the LaAlO₃/SrTiO₃ perovskite oxide interface. The fourth unit cell islands on top of a uniformly plane of a three unit cell of a LaAlO₃ film generate 2DEG in the underneath SrTiO₃ layer locally. When the island coverage ratio reaches a critical value of ca. 65%, 2DEG islands percolate to form a continuous conducting network. <boxed-text content-type="graphic" position="anchor" orientation="portrait"><graphic position="anchor" mimetype="image" xlink:href="ark:/27927/pgh30vc62pk" orientation="portrait" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /></boxed-text></p> </abstract>