Inelastic X‐ray scattering with 0.75 meV resolution at 25.7 keV using a temperature‐gradient analyzer. (1st January 2015)

• Record Type: Journal Article
• Authors: Ishikawa, Daisuke; Ellis, David S.; Uchiyama, Hiroshi; Baron, Alfred Q. R.
• Is Part Of: Journal of synchrotron radiation. Volume 22:Part 1(2015)
• Page Start: 3
• Page End: 9
• Publication Date: 2015-01-01
• Subjects: Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S1600577514021006
• Languages: English
• ISSNs: 0909-0495

Abstract

<abstract abstract-type="main" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <p>The use of temperature‐gradient analyzers for non‐resonant high‐resolution inelastic X‐ray scattering is investigated. The gradient compensates for geometrical broadening of the energy resolution by adjusting the lattice spacing of the analyzer crystal. Applying a ∼12 mK temperature gradient across a 9.5 cm analyzer, resolutions of 0.75 (2) meV FWHM at 25.7 keV for Si(13 13 13) and 1.25 (2) meV at 21.7 keV for Si(11 11 11) were measured, while retaining large (250 mm) clearance between the sample position and detector, and reasonable (9.3 mrad × 8.8 mrad) analyzer acceptance. The temperature control and stability are discussed.</p> </abstract>