Cite
HARVARD Citation
Hong, Y. et al. (n.d.). Discussion of 'Methods for planning repeated measures accelerated degradation tests' by B. Weaver and W. Q. Meeker. Applied stochastic models in business and industry. pp. 672-673. [Online].
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Hong, Y. et al. (n.d.). Discussion of 'Methods for planning repeated measures accelerated degradation tests' by B. Weaver and W. Q. Meeker. Applied stochastic models in business and industry. pp. 672-673. [Online].