The Diffraction Pattern Calculator (DPC) toolkit: a user‐friendly approach to unit‐cell lattice parameter identification of two‐dimensional grazing‐incidence wide‐angle X‐ray scattering data. (1st December 2014)

• Record Type: Journal Article
• Authors: Hailey, Anna K.; Hiszpanski, Anna M.; Smilgies, Detlef‐M.; Loo, Yueh‐Lin
• Is Part Of: Journal of applied crystallography. Volume 47:Part 6(2014:Dec.)
• Page Start: 2090
• Page End: 2099
• Publication Date: 2014-12-01
• Subjects: Crystallography -- Periodicals; 548.05
• DOI: 10.1107/S1600576714022006
• Languages: English
• ISSNs: 0021-8898

Abstract

<abstract abstract-type="main" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <p>The <italic>DPC</italic> toolkit is a simple‐to‐use computational tool that helps users identify the unit‐cell lattice parameters of a crystal structure that are consistent with a set of two‐dimensional grazing‐incidence wide‐angle X‐ray scattering data. The input data requirements are minimal and easy to assemble from data sets collected with any position‐sensitive detector, and the user is required to make as few initial assumptions about the crystal structure as possible. By selecting manual or automatic modes of operation, the user can either visually match the positions of the experimental and calculated reflections by individually tuning the unit‐cell parameters or have the program perform this process for them. Examples that demonstrate the utility of this program include determining the lattice parameters of a polymorph of a fluorinated contorted hexabenzocoronene in a blind test and refining the lattice parameters of the thin‐film phase of 5, 11‐bis(triethylsilylethynyl)anthradithiophene with the unit‐cell dimensions of its bulk crystal structure being the initial inputs.</p> </abstract>