Secondary ion mass spectrometry for Mg tracer diffusion: issues and solutions. (28th July 2014)

• Record Type: Journal Article
• Authors: Tuggle, Jay; Giordani, Andrew; Kulkarni, Nagraj; Warmack, Bruce; Hunter, Jerry; Lee, Yeonhee; Moon, DaeWon; Kang, Hee Jae; Kim, Kyung Joong; Lee, Tae Geol; Lee, Jae Cheol; Yi, Keewook; Hong, Tae Eun
• Is Part Of: Surface and interface analysis. Volume 46:Number 1(2014:Jan.)
• Page Start: 291
• Page End: 293
• Publication Date: 2014-07-28
• Subjects: Surfaces (Physics) -- Periodicals; Surface chemistry -- Periodicals; Thin films -- Periodicals; 541.33
• DOI: 10.1002/sia.5618
• Languages: English
• ISSNs: 0142-2421

Abstract

<abstract abstract-type="main"> <title> <x xml:space="preserve">Abstract</x> </title> <p>A secondary ion mass spectrometry (SIMS) method has been developed to measure stable Mg isotope tracer diffusion. This SIMS method was then used to calculate Mg self‐diffusivities, and the data was verified against historical data measured using radiotracers. The SIMS method has been validated as a reliable alternative to the radiotracer technique for the measurement of Mg self‐diffusion coefficients and can be used as a routine method for determining diffusion coefficients. Copyright © 2014 John Wiley &amp; Sons, Ltd.</p> </abstract>