Analysis of liposome model systems by time‐of‐flight secondary ion mass spectrometry. (27th October 2014)

• Record Type: Journal Article
• Authors: Lovrić, Jelena; Keighron, Jacqueline D.; Angerer, Tina B.; Li, Xianchan; Malmberg, Per; Fletcher, John S.; Ewing, Andrew G.; Lee, Yeonhee; Moon, DaeWon; Kang, Hee Jae; Kim, Kyung Joong; Lee, Tae Geol; Lee, Jae Cheol; Yi, Keewook; Hong, Tae Eun
• Is Part Of: Surface and interface analysis. Volume 46:Number 1(2014:Jan.)
• Page Start: 74
• Page End: 78
• Publication Date: 2014-10-27
• Subjects: Surfaces (Physics) -- Periodicals; Surface chemistry -- Periodicals; Thin films -- Periodicals; 541.33
• DOI: 10.1002/sia.5623
• Languages: English
• ISSNs: 0142-2421

Abstract

<abstract abstract-type="main"> <title> <x xml:space="preserve">Abstract</x> </title> <p>Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) is an important technique for studying chemical composition of micrometer scale objects because of its high spatial resolution imaging capabilities and chemical specificity. In this work, we focus on the application of ToF‐SIMS to gain insight into the chemistry of micrometer size liposomes as a potential model for neurotransmitter vesicles. Two models of giant liposomes were analyzed: histamine and aqueous two‐phase system‐containing liposomes. Characterization of the internal structure of single fixed liposomes was carried out both with the Bi₃⁺ and C₆₀⁺ ion sources. The depth profiling capability of ToF‐SIMS was used to investigate the liposome interior. Copyright © 2014 John Wiley &amp; Sons, Ltd.</p> </abstract>