ToF‐SIMS analysis of diadenosine triphosphate and didadenosine tetraphosphate using bismuth and argon cluster ion beams. (10th April 2014)
- Record Type:
- Journal Article
- Title:
- ToF‐SIMS analysis of diadenosine triphosphate and didadenosine tetraphosphate using bismuth and argon cluster ion beams. (10th April 2014)
- Main Title:
- ToF‐SIMS analysis of diadenosine triphosphate and didadenosine tetraphosphate using bismuth and argon cluster ion beams
- Authors:
- Shon, Hyun Kyong
Cho, Young‐Lai
Lim, Choung Su
Choi, Joon Sig
Chung, Sang J.
Lee, Tae Geol
Lee, Yeonhee
Moon, DaeWon
Kang, Hee Jae
Kim, Kyung Joong
Lee, Tae Geol
Lee, Jae Cheol
Yi, Keewook
Hong, Tae Eun - Abstract:
- <abstract abstract-type="main"> <title> <x xml:space="preserve">Abstract</x> </title> <p>In the past few decades, research has shown diadenosine polyphosphates (Ap<sub>n</sub>A) to be a family of intercellular and intracellular signaling molecules that play a key role in biological and pharmacological activities. ToF‐SIMS, recently shown to be a promising technique to analyze metabolites in biological samples due to its high sensitivity and specificity, was employed to analyze mixed diadenosine triphosphate (Ap<sub>3</sub>A) and diadenosine tetraphosphate (Ap<sub>4</sub>A) spiked in HeLa cell lysates by using bismuth and argon cluster ion beams. The molecular ion signals of Ap<sub>3</sub>A and Ap<sub>4</sub>A in the cell lysates were stronger when using an argon cluster ion beam than when using a bismuth cluster ion beam, although the detection limits of both molecules were the same. Using a correlation curve to indicate the molecular signal intensities and concentrations, the amount of Ap<sub>3</sub>A and Ap<sub>4</sub>A molecules in HeLa cell lysates could be quantified in the concentration range of 0.1 mM to 10 mM for Ap<sub>3</sub>A, and 5 mM and 20 mM for Ap<sub>4</sub>A. We believe that ToF‐SIMS analysis could be a powerful technique to detect important metabolite molecules such as Ap<sub>n</sub>A for biomedical applications, without the need for a separation process. Copyright © 2014 John Wiley & Sons, Ltd.</p> </abstract>
- Is Part Of:
- Surface and interface analysis. Volume 46:Number 1(2014:Jan.)
- Journal:
- Surface and interface analysis
- Issue:
- Volume 46:Number 1(2014:Jan.)
- Issue Display:
- Volume 46, Issue 1 (2014)
- Year:
- 2014
- Volume:
- 46
- Issue:
- 1
- Issue Sort Value:
- 2014-0046-0001-0000
- Page Start:
- 189
- Page End:
- 192
- Publication Date:
- 2014-04-10
- Subjects:
- Surfaces (Physics) -- Periodicals
Surface chemistry -- Periodicals
Thin films -- Periodicals
541.33 - Journal URLs:
- http://onlinelibrary.wiley.com/ ↗
- DOI:
- 10.1002/sia.5514 ↗
- Languages:
- English
- ISSNs:
- 0142-2421
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 8547.742000
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 3228.xml