Cite
HARVARD Citation
Bühler, R. et al. (2014). Comparison between experimental and simulated strain profiles in Ge channels with embedded source/drain stressors. Physica status solidi. 11 (11), pp. 1578-1582. [Online].
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Bühler, R. et al. (2014). Comparison between experimental and simulated strain profiles in Ge channels with embedded source/drain stressors. Physica status solidi. 11 (11), pp. 1578-1582. [Online].