RF‐SiP Reflectometer Technology for RF Testers. Issue 12 (17th November 2014)

• Record Type: Journal Article
• Authors: Kimishima, Masayuki; Nakayama, Yoshikazu; Kogami, Yoshinori
• Is Part Of: Electronics and communications in Japan. Volume 97:Issue 12(2014:Dec.)
• Page Start: 70
• Page End: 85
• Publication Date: 2014-11-17
• Subjects: Electronics -- Periodicals; Telecommunication -- Periodicals; 621.6805
• DOI: 10.1002/ecj.11621
• Languages: English
• ISSNs: 1942-9533

Abstract

<abstract abstract-type="main"> <title>SUMMARY</title> <p>Technologies of small size reflectometers constructed in the form of RF functional systems in packages (SiPs) for RF testers are described. As primary concerns, focusing on the directivity and dynamic range of the reflectometer performance, we propose the construction and core circuit topologies to realize a very small reflectometer SiP that satisfies the functions of vector network analysis for RF testers. The reflectometer features a very small size, less than 1/50 of our conventional hybrid form reflectometer, and has good performance for RF testers.</p> </abstract>