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HARVARD Citation
Ohta, N. et al. (n.d.). Absolute scale calibration with use of excess scattering length for small‐angle X‐ray scattering. Journal of applied crystallography. pp. 654-658. [Online].
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Ohta, N. et al. (n.d.). Absolute scale calibration with use of excess scattering length for small‐angle X‐ray scattering. Journal of applied crystallography. pp. 654-658. [Online].