Data processing software suite SITENNO for coherent X‐ray diffraction imaging using the X‐ray free‐electron laser SACLA. (17th March 2014)

• Record Type: Journal Article
• Authors: Sekiguchi, Yuki; Oroguchi, Tomotaka; Takayama, Yuki; Nakasako, Masayoshi
• Is Part Of: Journal of synchrotron radiation. Volume 21:Part 3(2014)
• Page Start: 600
• Page End: 612
• Publication Date: 2014-03-17
• Subjects: Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S1600577514003439
• Languages: English
• ISSNs: 0909-0495

Abstract

<abstract abstract-type="main" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <p>Coherent X‐ray diffraction imaging is a promising technique for visualizing the structures of non‐crystalline particles with dimensions of micrometers to sub‐micrometers. Recently, X‐ray free‐electron laser sources have enabled efficient experiments in the `diffraction before destruction' scheme. Diffraction experiments have been conducted at SPring‐8 Angstrom Compact free‐electron LAser (SACLA) using the custom‐made diffraction apparatus KOTOBUKI‐1 and two multiport CCD detectors. In the experiments, ten thousands of single‐shot diffraction patterns can be collected within several hours. Then, diffraction patterns with significant levels of intensity suitable for structural analysis must be found, direct‐beam positions in diffraction patterns determined, diffraction patterns from the two CCD detectors merged, and phase‐retrieval calculations for structural analyses performed. A software suite named <italic>SITENNO</italic> has been developed to semi‐automatically apply the four‐step processing to a huge number of diffraction data. Here, details of the algorithm used in the suite are described and the performance for approximately 9000 diffraction patterns collected from cuboid‐shaped copper oxide particles reported. Using the <italic>SITENNO</italic> suite, it is possible to conduct experiments with data processing immediately after the data collection, and to characterize the size distribution and internal structures of the non‐crystalline particles.</p> </abstract>