Revisit to diffraction anomalous fine structure. (1st October 2014)

• Record Type: Journal Article
• Authors: Kawaguchi, T.; Fukuda, K.; Tokuda, K.; Shimada, K.; Ichitsubo, T.; Oishi, M.; Mizuki, J.; Matsubara, E.
• Is Part Of: Journal of synchrotron radiation. Volume 21:Part 6(2014)
• Page Start: 1247
• Page End: 1251
• Publication Date: 2014-10-01
• Subjects: Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S1600577514015148
• Languages: English
• ISSNs: 0909-0495

Abstract

<abstract abstract-type="main" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <p>The diffraction anomalous fine structure (DAFS) method that is a spectroscopic analysis combined with resonant X‐ray diffraction enables the determination of the valence state and local structure of a selected element at a specific crystalline site and/or phase. This method has been improved by using a polycrystalline sample, channel‐cut monochromator optics with an undulator synchrotron radiation source, an area detector and direct determination of resonant terms with a logarithmic dispersion relation. This study makes the DAFS method more convenient and saves a large amount of measurement time in comparison with the conventional DAFS method with a single crystal. The improved DAFS method has been applied to some model samples, Ni foil and Fe₃O₄ powder, to demonstrate the validity of the measurement and the analysis of the present DAFS method.</p> </abstract>