Cluster TOF‐SIMS imaging as a tool for micrometric histology of lipids in tissue. Issue 6 (21st November 2013)

• Record Type: Journal Article
• Authors: Bich, Claudia; Touboul, David; Brunelle, Alain
• Is Part Of: Mass spectrometry reviews. Volume 33:Issue 6(2014:Nov./Dec.)
• Page Start: 442
• Page End: 451
• Publication Date: 2013-11-21
• Subjects: Mass spectrometry -- Periodicals; 543
• DOI: 10.1002/mas.21399
• Languages: English
• ISSNs: 0277-7037

Abstract

<abstract abstract-type="main" xml:lang="en"> <title>Abstract</title> <sec id="mas21399-sec-0001" sec-type="section"> <p>Recent developments in instrumentation, ion beams or analyzers, for cluster time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) imaging are described here. The methods which are employed to increase the sensitivity or to perform three‐dimensional analyses in the organic materials are also illustrated. This review shows the improvements made for lipid imaging by cluster TOF‐SIMS in various types of material and applications, and gives reasons for the expansion of its utilization. © 2013 Wiley Periodicals, Inc. Mass Spec Rev 33: 442–451, 2014.</p> </sec> </abstract>