Semi‐Supervised Learning in Inferring Mobile Device Locations. (October 2014)
- Record Type:
- Journal Article
- Title:
- Semi‐Supervised Learning in Inferring Mobile Device Locations. (October 2014)
- Main Title:
- Semi‐Supervised Learning in Inferring Mobile Device Locations
- Authors:
- Duan, Rong
Hong, Olivia
Ma, Guangqin
Li, Jing
Kulahci, Murat - Abstract:
- <abstract abstract-type="main"> <title> <x xml:space="preserve">Abstract</x> </title> <p>With the development of mobility technology, location information has become collectible by various positioning technologies. Different positioning technologies have their advantages and limitations. In particular, location accuracy varies among different technologies. In this paper, we propose semi‐supervised learning in inferring low‐accuracy location data density from high‐accuracy location data density. We focus on the enormous amount of low‐accuracy cell tower triangulation (CTT) calculated mobile device location data and the small amount of high‐accuracy assisted global positioning system (AGPS) pinpointed location data. The CTT and AGPS mobile device location data are collected for each cell tower that serves the devices, and then, the actual distribution is learned from both CTT and AGPS data by semi‐supervised learning, and the likelihood for low‐accuracy CTT location can be used as an accuracy indicator. The proposed method takes the advantage of the existing extensively collected location data and augments it by a machine‐learning algorithm. The method does not only complement the downside of one technology with the other technology but also considers the computing efficiency by extracting features that can segment the large data naturally, which is the essential in divide‐and‐conquer distributed big data processing. This big data approach improves the location accuracy<abstract abstract-type="main"> <title> <x xml:space="preserve">Abstract</x> </title> <p>With the development of mobility technology, location information has become collectible by various positioning technologies. Different positioning technologies have their advantages and limitations. In particular, location accuracy varies among different technologies. In this paper, we propose semi‐supervised learning in inferring low‐accuracy location data density from high‐accuracy location data density. We focus on the enormous amount of low‐accuracy cell tower triangulation (CTT) calculated mobile device location data and the small amount of high‐accuracy assisted global positioning system (AGPS) pinpointed location data. The CTT and AGPS mobile device location data are collected for each cell tower that serves the devices, and then, the actual distribution is learned from both CTT and AGPS data by semi‐supervised learning, and the likelihood for low‐accuracy CTT location can be used as an accuracy indicator. The proposed method takes the advantage of the existing extensively collected location data and augments it by a machine‐learning algorithm. The method does not only complement the downside of one technology with the other technology but also considers the computing efficiency by extracting features that can segment the large data naturally, which is the essential in divide‐and‐conquer distributed big data processing. This big data approach improves the location accuracy statistically without the added complexity and cost of upgrading or replacing mobile networks or devices. Moreover, also, the proposed method focuses on the location density alignment, which avoids tracking individual user devices and preserves user privacy. Copyright © 2014 John Wiley &amp; Sons, Ltd.</p> </abstract> … (more)
- Is Part Of:
- Quality and reliability engineering international. Volume 30:Number 6(2014:Oct.)
- Journal:
- Quality and reliability engineering international
- Issue:
- Volume 30:Number 6(2014:Oct.)
- Issue Display:
- Volume 30, Issue 6 (2014)
- Year:
- 2014
- Volume:
- 30
- Issue:
- 6
- Issue Sort Value:
- 2014-0030-0006-0000
- Page Start:
- 857
- Page End:
- 866
- Publication Date:
- 2014-10
- Subjects:
- Reliability (Engineering) -- Periodicals
Quality control -- Periodicals
High technology -- Periodicals
620.00452 - Journal URLs:
- http://www3.interscience.wiley.com/cgi-bin/jhome/3680 ↗
http://onlinelibrary.wiley.com/ ↗ - DOI:
- 10.1002/qre.1701 ↗
- Languages:
- English
- ISSNs:
- 0748-8017
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 7168.137300
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 4037.xml