20.7% efficient ion‐implanted large area n‐type front junction silicon solar cells with rear point contacts formed by laser opening and physical vapor deposition. (31st July 2014)

• Record Type: Journal Article
• Authors: Tao, Yuguo; Payne, Adam; Upadhyaya, Vijaykumar D.; Rohatgi, Ajeet
• Is Part Of: Progress in photovoltaics. Volume 22:Number 10(2014)
• Page Start: 1030
• Page End: 1039
• Publication Date: 2014-07-31
• Subjects: Solar cells -- Periodicals; Photovoltaic cells -- Periodicals; Solar power plants -- Periodicals; 621.31245
• DOI: 10.1002/pip.2545
• Languages: English
• ISSNs: 1062-7995

Abstract

<abstract abstract-type="main"> <title>ABSTRACT</title> <p>In this work, we report on ion‐implanted, high‐efficiency <italic>n</italic>‐type silicon solar cells fabricated on large area pseudosquare Czochralski wafers. The sputtering of aluminum (Al) via physical vapor deposition (PVD) in combination with a laser‐patterned dielectric stack was used on the rear side to produce front junction cells with an implanted boron emitter and a phosphorus back surface field. Front and back surface passivation was achieved by thin thermally grown oxide during the implant anneal. Both front and back oxides were capped with SiN<sub>x</sub>, followed by screen‐printed metal grid formation on the front side. An ultraviolet laser was used to selectively ablate the SiO<sub>2</sub>/SiN<sub>x</sub> passivation stack on the back to form the pattern for metal–Si contact. The laser pulse energy had to be optimized to fully open the SiO<sub>2</sub>/SiN<sub>x</sub> passivation layers, without inducing appreciable damage or defects on the surface of the <italic>n<sup>+</sup></italic> back surface field layer. It was also found that a low temperature annealing for less than 3 min after PVD Al provided an excellent charge collecting contact on the back. In order to obtain high fill factor of ~80%, an <italic>in situ</italic> plasma etching in an inert ambient prior to PVD was found to be essential for etching the native oxide formed in the rear vias during the front contact firing. Finally, through optimization of the size and pitch of the rear point contacts, an efficiency of 20.7% was achieved for the large area <italic>n</italic>‐type passivated emitter, rear totally diffused cell. Copyright © 2014 John Wiley & Sons, Ltd.</p> </abstract>