19.2: Distinguished Paper: Characterization of Electron‐Hole Pair Migration and Trapping in Rare Earth Doped YBO3 under Vacuum Ultraviolet Excitation. Issue 1 (1st July 2013)

• Record Type: Journal Article
• Authors: Wallace, Max; Diaz, Anthony L.
• Is Part Of: Digest of technical papers. Volume 44:Issue 1(2013)
• Page Start: 210
• Page End: 213
• Publication Date: 2013-07-01
• Subjects: Information display systems -- Congresses; 621.3815422
• DOI: 10.1002/j.2168-0159.2013.tb06181.x
• Languages: English
• ISSNs: 0097-966X

Abstract

<abstract abstract-type="main" xml:lang="en"> <title>Abstract</title> <p>We have measured host‐to‐activator energy transfer efficiencies in rare‐earth doped YBO₃ under vacuum ultraviolet excitation. From these data, relative electron‐hole (e‐h) pair trapping rate constants can be estimated. Our analysis suggests a correlation between e‐h trapping efficiency and the energy of activator electronic states relative to the host conduction band.</p> </abstract>