Ronchi test for characterization of X‐ray nanofocusing optics and beamlines. (31st July 2014)

• Record Type: Journal Article
• Authors: Uhlén, Fredrik; Rahomäki, Jussi; Nilsson, Daniel; Seiboth, Frank; Sanz, Claude; Wagner, Ulrich; Rau, Christoph; Schroer, Christian G.; Vogt, Ulrich
• Is Part Of: Journal of synchrotron radiation. Volume 21:Part 5(2014)
• Page Start: 1105
• Page End: 1109
• Publication Date: 2014-07-31
• Subjects: Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S160057751401323X
• Languages: English
• ISSNs: 0909-0495

Abstract

<abstract abstract-type="main" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <p>A Ronchi interferometer for hard X‐rays is reported in order to characterize the performance of the nanofocusing optics as well as the beamline stability. Characteristic interference fringes yield qualitative data on present aberrations in the optics. Moreover, the visibility of the fringes on the detector gives information on the degree of spatial coherence in the beamline. This enables the possibility to detect sources of instabilities in the beamline like vibrations of components or temperature drift. Examples are shown for two different nanofocusing hard X‐ray optics: a compound refractive lens and a zone plate.</p> </abstract>