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HARVARD Citation
Siewert, F. et al. (2014). On the characterization of ultra‐precise X‐ray optical components: advances and challenges in ex situ metrology. Journal of synchrotron radiation. pp. 968-975. [Online].
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Siewert, F. et al. (2014). On the characterization of ultra‐precise X‐ray optical components: advances and challenges in ex situ metrology. Journal of synchrotron radiation. pp. 968-975. [Online].