High-Resolution Scanning Transmission Electron Microscopy Study of Black Spot Defects in Ion Irradiated Silicon Carbide. (August 2014) - He, Li; Zhai, Yizhang; Liu, Cheng; Jiang, Chao; Szlufarska, Izabela; Tyburska-Puschel, Beata; Sridharan, Kumar; Voyles, Paul