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HARVARD Citation
Parish, C. et al. (n.d.). Atomic-Resolution Investigation of Irradiation-Induced Defects in Silicon Carbide. Microscopy and microanalysis. pp. 1042-1043. [Online].
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Parish, C. et al. (n.d.). Atomic-Resolution Investigation of Irradiation-Induced Defects in Silicon Carbide. Microscopy and microanalysis. pp. 1042-1043. [Online].