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Darbal, A. et al. (n.d.). Applications of Automated High Resolution Strain Mapping in TEM on the Study of Strain Distribution in MOSFETs. Microscopy and microanalysis. pp. 1066-1067. [Online].
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Darbal, A. et al. (n.d.). Applications of Automated High Resolution Strain Mapping in TEM on the Study of Strain Distribution in MOSFETs. Microscopy and microanalysis. pp. 1066-1067. [Online].