Cite
HARVARD Citation
Wu, L. et al. (n.d.). Revealing the Origin of "Phonon Glass-Electron Crystal" Behavior in Thermoelectric Layered Cobaltate by Accurate Displacement Measurement. Microscopy and microanalysis. pp. 434-435. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Wu, L. et al. (n.d.). Revealing the Origin of "Phonon Glass-Electron Crystal" Behavior in Thermoelectric Layered Cobaltate by Accurate Displacement Measurement. Microscopy and microanalysis. pp. 434-435. [Online].