Cite
HARVARD Citation
Liebel, A. et al. (n.d.). A Detector for Fast Electron Current Measurements based on Silicon Drift Detector Technology. Microscopy and microanalysis. pp. 28-29. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Liebel, A. et al. (n.d.). A Detector for Fast Electron Current Measurements based on Silicon Drift Detector Technology. Microscopy and microanalysis. pp. 28-29. [Online].