Cite
HARVARD Citation
Gorni, M. et al. (n.d.). Electrical characterization of a buried GaSb p‐n junction controlled by native defects. Crystal research and technology. 49 (8), pp. 628-633. [Online].
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Gorni, M. et al. (n.d.). Electrical characterization of a buried GaSb p‐n junction controlled by native defects. Crystal research and technology. 49 (8), pp. 628-633. [Online].