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Sasaki, T. et al. (n.d.). Defect characterization in compositionally graded InGaAs layers on GaAs(001) grown by MBE. Physica status solidi. 10 (11), pp. 1640-1643. [Online].
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Sasaki, T. et al. (n.d.). Defect characterization in compositionally graded InGaAs layers on GaAs(001) grown by MBE. Physica status solidi. 10 (11), pp. 1640-1643. [Online].