Comparative study on nano‐scale III‐V double‐gate MOSFETs with various channel materials. Issue 11 (24th October 2013)
- Record Type:
- Journal Article
- Title:
- Comparative study on nano‐scale III‐V double‐gate MOSFETs with various channel materials. Issue 11 (24th October 2013)
- Main Title:
- Comparative study on nano‐scale III‐V double‐gate MOSFETs with various channel materials
- Authors:
- Nishida, Akio
Hasegawa, Kei
Ohama, Ryoko
Fujikawa, Sachie
Hara, Shinsuke
Fujishiro, Hiroki I.
Yamaguchi, Hiroshi
Kumakura, Kazuhide - Abstract:
- <abstract abstract-type="main" xml:lang="en"> <title>Abstract</title> <p>The current drivability of III‐V double gate MOSFETs with various channel materials are investigated by using quantum‐corrected Monte Carlo simulation. The InGaAs channel shows the largest electron injection velocity <italic>v</italic><sub>inj</sub>. However, the backward currents by alloy scattering (AL) in the channel and by non‐polar optical phonon scattering (NPOP) in the drain decrease the average electron velocity <italic>v</italic><sub>s</sub> from <italic>v</italic><sub>inj</sub> even at <italic>L</italic><sub>g</sub> of 10 nm. In the GaAs channel, in addition to the decrease in <italic>v</italic><sub>inj</sub> by the <italic>L</italic> valleys conduction, NPOP and polar optical phonon scattering (POP) cause the backward currents, which decrease <italic>v</italic><sub>s</sub> further from <italic>v</italic><sub>inj</sub>. The InP channel shows the smallest <italic>v</italic><sub>inj</sub>, however, the backward current by POP in the channel is small and that by NPOP in the drain is almost negligible. Therefore <italic>v</italic><sub>s</sub> is almost reaching <italic>v</italic><sub>inj</sub> at <italic>L</italic><sub>g</sub> of 10 nm. On the other hand, the electron density <italic>n</italic><sub>b</sub> is largest in the InP channel owing to the large <italic>C</italic><sub>gs</sub>. Eventually, the InP channel shows the largest <italic>I</italic><sub>ds</sub>. (© 2013 WILEY‐VCH Verlag GmbH<abstract abstract-type="main" xml:lang="en"> <title>Abstract</title> <p>The current drivability of III‐V double gate MOSFETs with various channel materials are investigated by using quantum‐corrected Monte Carlo simulation. The InGaAs channel shows the largest electron injection velocity <italic>v</italic><sub>inj</sub>. However, the backward currents by alloy scattering (AL) in the channel and by non‐polar optical phonon scattering (NPOP) in the drain decrease the average electron velocity <italic>v</italic><sub>s</sub> from <italic>v</italic><sub>inj</sub> even at <italic>L</italic><sub>g</sub> of 10 nm. In the GaAs channel, in addition to the decrease in <italic>v</italic><sub>inj</sub> by the <italic>L</italic> valleys conduction, NPOP and polar optical phonon scattering (POP) cause the backward currents, which decrease <italic>v</italic><sub>s</sub> further from <italic>v</italic><sub>inj</sub>. The InP channel shows the smallest <italic>v</italic><sub>inj</sub>, however, the backward current by POP in the channel is small and that by NPOP in the drain is almost negligible. Therefore <italic>v</italic><sub>s</sub> is almost reaching <italic>v</italic><sub>inj</sub> at <italic>L</italic><sub>g</sub> of 10 nm. On the other hand, the electron density <italic>n</italic><sub>b</sub> is largest in the InP channel owing to the large <italic>C</italic><sub>gs</sub>. Eventually, the InP channel shows the largest <italic>I</italic><sub>ds</sub>. (© 2013 WILEY‐VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</p> </abstract> … (more)
- Is Part Of:
- Physica status solidi. Volume 10:Issue 11(2013:Nov.)
- Journal:
- Physica status solidi
- Issue:
- Volume 10:Issue 11(2013:Nov.)
- Issue Display:
- Volume 10, Issue 11 (2013)
- Year:
- 2013
- Volume:
- 10
- Issue:
- 11
- Issue Sort Value:
- 2013-0010-0011-0000
- Page Start:
- 1413
- Page End:
- 1416
- Publication Date:
- 2013-10-24
- Subjects:
- Solid state physics -- Congresses
Solid state physics -- Periodicals
Solid state physics
Conference proceedings
Periodicals
530.41 - Journal URLs:
- http://mclink.library.mcgill.ca/sfx?url_ver=Z39.88-2004&ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&rfr_id=info:sid/sfxit.com:opac_856&url_ctx_fmt=info:ofi/fmt:kev:mtx:ctx&sfx.ignore_date_threshold=1&rft.object_id=1000000000365490&svc_val_fmt=info:ofi/fmt:kev:mtx:sch_svc& ↗
http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)1610-1642a ↗
http://onlinelibrary.wiley.com/ ↗ - DOI:
- 10.1002/pssc.201300264 ↗
- Languages:
- English
- ISSNs:
- 1862-6351
- Deposit Type:
- Legaldeposit
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- Available online (eLD content is only available in our Reading Rooms) ↗
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British Library HMNTS - ELD Digital store - Ingest File:
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