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Kachkanov, V. et al. (n.d.). Characterisation of III‐nitride materials by synchrotron X‐ray microdiffraction reciprocal space mapping. Physica status solidi. 10 (3), pp. 481-485. [Online].
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Kachkanov, V. et al. (n.d.). Characterisation of III‐nitride materials by synchrotron X‐ray microdiffraction reciprocal space mapping. Physica status solidi. 10 (3), pp. 481-485. [Online].