Data analysis method to achieve sub‐10 pm spatial resolution using extended X‐ray absorption fine‐structure spectroscopy. (11th June 2014)

• Record Type: Journal Article
• Authors: Du, Yonghua; Wang, Jia‐ou; Jiang, Longhua; Borgna, Lucas Santiago; Wang, Yanfei; Zheng, Yi; Hu, Tiandou
• Is Part Of: Journal of synchrotron radiation. Volume 21:Part 4(2014)
• Page Start: 756
• Page End: 761
• Publication Date: 2014-06-11
• Subjects: Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S1600577514010406
• Languages: English
• ISSNs: 0909-0495

Abstract

<abstract abstract-type="main" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <p>Obtaining sub‐10 pm spatial resolution by extended X‐ray absorption fine structure (EXAFS) spectroscopy is required in many important fields of research, such as lattice distortion studies in colossal magnetic resistance materials, high‐temperature superconductivity materials <italic>etc.</italic> However, based on the existing EXAFS data analysis methods, EXAFS has a spatial resolution limit of π/2Δ<italic>k</italic> which is larger than 0.1 Å. In this paper a new data analysis method which can easily achieve sub‐10 pm resolution is introduced. Theoretically, the resolution limit of the method is three times better than that normally available. The method is examined by numerical simulation and experimental data. As a demonstration, the LaFe_{1–<italic>x</italic>}Cr_{<italic>x</italic>}O₃ system (<italic>x</italic> = 0, 1/3, 2/3) is studied and the structural information of FeO₆ octahedral distortion as a function of Cr doping is resolved directly from EXAFS, where a resolution better than 0.074 Å is achieved.</p> </abstract>