Retrieval of the atomic displacements in the crystal from the coherent X‐ray diffraction pattern. (2nd June 2014)

• Record Type: Journal Article
• Authors: Minkevich, A. A.; Köhl, M.; Escoubas, S.; Thomas, O.; Baumbach, T.
• Is Part Of: Journal of synchrotron radiation. Volume 21:Part 4(2014)
• Page Start: 774
• Page End: 783
• Publication Date: 2014-06-02
• Subjects: Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S1600577514010108
• Languages: English
• ISSNs: 0909-0495

Abstract

<abstract abstract-type="main" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <p>The retrieval of spatially resolved atomic displacements is investigated <italic>via</italic> the phases of the direct(real)‐space image reconstructed from the strained crystal's coherent X‐ray diffraction pattern. It is demonstrated that limiting the spatial variation of the first‐ and second‐order spatial displacement derivatives improves convergence of the iterative phase‐retrieval algorithm for displacements reconstructions to the true solution. This approach is exploited to retrieve the displacement in a periodic array of silicon lines isolated by silicon dioxide filled trenches.</p> </abstract>