Combined Scanning Transmission Electron Microscopy Tilt- and Focal Series. (19th February 2014)

• Record Type: Journal Article
• Authors: Dahmen, Tim; Baudoin, Jean-Pierre; Lupini, Andrew R.; Kübel, Christian; Slusallek, Philipp; de Jonge, Niels
• Is Part Of: Microscopy and microanalysis. Volume 20:Number 2(2014:Apr.)
• Page Start: 548
• Page End: 560
• Publication Date: 2014-02-19
• Subjects: Microscopy -- Periodicals; Microchemistry -- Periodicals; 502.82
• DOI: 10.1017/S1431927614000075
• Languages: English
• ISSNs: 1431-9276

Abstract

<abstract abstract-type="normal"> <title>Abstract</title> <p>In this study, a combined tilt- and focal series is proposed as a new recording scheme for high-angle annular dark-field scanning transmission electron microscopy (STEM) tomography. Three-dimensional (3D) data were acquired by mechanically tilting the specimen, and recording a through-focal series at each tilt direction. The sample was a whole-mount macrophage cell with embedded gold nanoparticles. The tilt–focal algebraic reconstruction technique (TF-ART) is introduced as a new algorithm to reconstruct tomograms from such combined tilt- and focal series. The feasibility of TF-ART was demonstrated by 3D reconstruction of the experimental 3D data. The results were compared with a conventional STEM tilt series of a similar sample. The combined tilt- and focal series led to smaller "missing wedge" artifacts, and a higher axial resolution than obtained for the STEM tilt series, thus improving on one of the main issues of tilt series-based electron tomography.</p> </abstract>