The Stanford Nanocharacterization Laboratory (SNL) and Recent Applications of an Aberration‐Corrected Environmental Transmission Electron Microscopea. Issue 5 (30th April 2014)

• Record Type: Journal Article
• Authors: Sinclair, Robert; Kempen, Paul Joseph; Chin, Richard; Koh, Ai Leen; Zschech, Ehrenfried
• Is Part Of: Advanced engineering materials. Volume 16:Issue 5(2014:May)
• Page Start: 476
• Page End: 481
• Publication Date: 2014-04-30
• Subjects: Materials -- Periodicals; 620.11
• DOI: 10.1002/adem.201400015
• Languages: English
• ISSNs: 1438-1656

Abstract

<abstract abstract-type="main" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <sec id="adem201400015-sec-0001" sec-type="section"> <p>This article describes the establishment, over a period of 10 years or so, of a multi‐user, institution‐wide facility for the characterization of materials and devices at the nanoscale. Emphasis is placed on the type of equipment that we have found to be most useful for our users, and the business strategy that maintains its operations. A central component of our facility is an aberration‐corrected environmental transmission electron microscope and its application is summarized in the studies of plasmon energies of silver nanoparticles, the band gap of PbS quantum dots, atomic site occupancy near grain boundaries in yttria stabilized zirconia, the lithiation of silicon nanoparticles, in situ observations on carbon nanotube oxidation and the electron tomography of varicella zoster virus nucleocapsids.</p> </sec> </abstract>