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HARVARD Citation
Fischer, G. et al. (n.d.). Analysis of stress gradients in physical vapour deposition multilayers by X‐ray diffraction at fixed depth intervals. Journal of applied crystallography. pp. 335-345. [Online].
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Fischer, G. et al. (n.d.). Analysis of stress gradients in physical vapour deposition multilayers by X‐ray diffraction at fixed depth intervals. Journal of applied crystallography. pp. 335-345. [Online].