X‐ray quasi‐lamellar etched multilayers: analysis by coupled‐mode theory†. (11th December 2013)

• Record Type: Journal Article
• Authors: André, Jean‐Michel; Guen, Karine Le; Jonnard, Philippe
• Is Part Of: X-ray spectrometry. Volume 43:Number 2(2014)
• Page Start: 122
• Page End: 125
• Publication Date: 2013-12-11
• Subjects: X-ray spectroscopy -- Periodicals; 543.62
• DOI: 10.1002/xrs.2526
• Languages: English
• ISSNs: 0049-8246

Abstract

<abstract abstract-type="main"> <title> <x xml:space="preserve">Abstract</x> </title> <p>An etched multilayer (EM) is a two‐dimensional structure obtained by etching a periodic multilayer following the profile of a grating. Generally, a laminar grating shape, that is, with a rectangular shape, is desired. However, we observe that different EMs give different diffraction efficiency curves. We implement the coupled‐mode theory to calculate the diffraction pattern of the EM as a function of the shape of the etching profile. Thus, we try to correlate the variability of the experimental reflectivity curves to various shapes of the profiles, rectangular and trapezoidal, and the corresponding simulated reflectivity curves. Copyright © 2013 John Wiley &amp; Sons, Ltd.</p> </abstract>