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HARVARD Citation
Pelliccia, D. et al. (n.d.). Characterization of thin films for X‐ray and neutron waveguiding by X‐ray reflectivity and atomic force microscopy. Physica status solidi. 210 (11), pp. 2416-2422. [Online].
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Pelliccia, D. et al. (n.d.). Characterization of thin films for X‐ray and neutron waveguiding by X‐ray reflectivity and atomic force microscopy. Physica status solidi. 210 (11), pp. 2416-2422. [Online].